[Rasch] IOMW 2008 Preliminary Program

rsmith.arm at att.net rsmith.arm at att.net
Sat Feb 9 06:13:53 EST 2008

The preliminary program for IOMW 2008 is now available.  The conference will be held March 22 and 23, 2008 at New York University (NYU) in New York City.  There are 48 paper presentations and 2 computer demonstrations scheduled for the two day conference.  The preliminary program can be found on the Journal of Applied Measurement web site (http://www.jampress.org).  Just scroll down to and click on the IOMW button.  The preliminary program is available at the bottom of the IOMW page as a printable pdf.  The same program is also available on the IOMW page of the Data Recognition Corporation web site (http://www.datarecognitioncorp.com).

Early registration is currently open and in effect until March 14, 2008.  Register now and save $10 on the registration fee.  Late and onsite registration will also be available.  The registration form can also be found at the two web sites listed above.

The meeting is held the two days prior to AERA in New York City and provides an excellent opportunity to hear about the latest developments in measurement.  Hotel information can also be found on the DRC web site or by going directly to the NYU web site. 

Please feel free to contact the IOMW organizers at IOMW at datarecognitioncorp.com or IOMW2008 at att.net.

Hope to see many of you in New York!

Richard M. Smith, Editor 
Journal of Applied Measurement 

P.O. Box 1283 
Maple Grove, MN 55311 USA 
(JAM web site) 
voice: 763-268-2282 (w) 
fax: 763-268-2782 
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