[Rasch] IOMW 2008 Registration

rsmith.arm at att.net rsmith.arm at att.net
Sat Feb 23 04:00:52 EST 2008

For those of you thinking about attending IOMW 2008 at NYU in New York City on March 22 and 23, 2008, the registration process is open and there are only two weeks left in the early registration period.  IOMW meets just prior to the AERA annual meeting, so it is a good opportunity to take part in both meetings.

IOMW 2008 will offer over 50 presentations in 14 sessions over the two days.  There are several computer software sessions available, as well as the usual paper and symposium sessions.  The preliminary program is available and it looks like a interesting IOMW.  Registration is $40 USD (early) and $50 USD (late).  To receive the reduced early registration fee your payment information must be received by March 14, 2008.

The registration from is available on the Journal of Applied Measurement web site (http://www.jampress.org).  Click on IOMW 2008  on the right side and scroll down to the registration form.  The form is available as a printable pdf that can be mailed, or e-mailed when completed.  The same information is also available on the Data Recognition Corporation web site (http://www.datarecognitioncorp.com).  

If you have any questions about IOMW 2008 please contact the organizing committee at iomw at datarecognitioncorp.com or IOMW2008 at att.net.

Looking forward to seeing you all at IOMW 2008!

Richard M. Smith, Editor 
Journal of Applied Measurement 

P.O. Box 1283 
Maple Grove, MN 55311 USA 
(JAM web site) 
voice: 763-268-2282 (w) 
fax: 763-268-2782 
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