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rsmith.arm at att.net rsmith.arm at att.net
Sat Jan 26 06:33:26 EST 2008

For those of you thinking about attending IOMW 2008 at NYU in New Your City on March 22 and 23, 2008, the registration process is now open.  IOMW meets just prior to the AERA annual meeting.

IOMW 2008 will offer over 50 presentations in 14 sessions over the two days.  There are several computer software sessions available, as well as the usual paper and symposium sessions.  The preliminary program will be available on February 5, 2008.  Registration is $40 USD (early) and $50 USD (late).  To receive the reduced early registration fee your payment information must be received by March 14, 2008.

The registration from is available on the Journal of Applied Measurement web site (http://www.jampress.org/).  Click on IOMW 2008  on the right side and scroll down to the registration form.  The form is available as a printable pdf that can be faxed, mailed, or e-mailed when completed.  On February 5 the preliminary program will be available on the same web page.

If you have any questions about IOMW 2008 please contact the organizing committee at iomw at datarecognitioncorp.com or IOMW2008 at att.net.

Richard M. Smith, Editor 
Journal of Applied Measurement 

P.O. Box 1283 
Maple Grove, MN 55311 USA 
(JAM web site) 
voice: 763-268-2282 (w) 
fax: 763-268-2782 
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