[Rasch] IOMW 2008 Registration

rsmith.arm at att.net rsmith.arm at att.net
Tue Mar 4 08:05:03 EST 2008


For those of you thinking about attending IOMW 2008 at NYU in New York City on March 22 and 23, 2008, the registration process is open and there are only 10 days left in the early registration period.  IOMW meets just prior to the AERA annual meeting, so it is a good opportunity to take part in both meetings.

IOMW 2008 will offer over 50 presentations in 14 sessions during the two day meeting.  There are several computer software sessions available, as well as the usual paper and symposium sessions.  The preliminary program is available and it looks like a interesting IOMW.  Registration is $40 USD (early) and $50 USD (late).  To receive the reduced early registration fee your payment information must be received by March 14, 2008.  

Please Note:

With the high security in New York City, it will be necessary to present a photo ID to enter the NYU classroom buildings.  Each participant's name will also have to appear on the attendee list provided to security.  If you are planning to use on-site registration, it will be necessary to e-mail the organizing committee  by March 17 to have your name added to the attendee list.  E-mail addresses for this purpose are listed below.  IOMW will meet in rooms 713 and 714 of the Silver Center, 100 Washington Square East, New York, NY  10003.

The registration from is available on the Journal of Applied Measurement web site (http://www.jampress.org).  Click on IOMW 2008  on the right side and scroll down to the registration form.  The form is available as a printable pdf that can be mailed, or e-mailed when completed.  The same information is also available on the Data Recognition Corporation web site (http://www.datarecognitioncorp.com).  

If you have any questions about IOMW 2008 please contact the organizing committee at iomw at datarecognitioncorp.com or IOMW2008 at att.net.

Looking forward to seeing you all at IOMW 2008!

--
Richard M. Smith, Editor 
Journal of Applied Measurement 

P.O. Box 1283 
Maple Grove, MN 55311 USA 
(JAM web site) 
http://www.jampress.org 
voice: 763-268-2282 (w) 
fax: 763-268-2782 
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