[Rasch] Nov. 2012 Rasch Measurement Workshop
rsmith at jampress.org
rsmith at jampress.org
Thu Aug 23 03:41:12 EST 2012
We are pleased to announce that we have scheduled a Rasch measurement workshop for November 2 and 3, 2012 in Chicago.
This two-day workshop is described below. Registration materials are available on the Rasch Measurement Workshops page at www.jampress.org.
A brief description of the workshop is provided below.
An Introduction to Rasch Measurement: Theory and Applications
November 2-3, 2012 at the Avenue Crowne Plaza
The purpose of this training session is to introduce participants to the theory and applications of Rasch measurement. This session will provide participants with the necessary tools to become effective consumers of research employing Rasch measurement and the skills necessary to solve practical measurement problems. Instructional material will be based on four Rasch measurement models: dichotomous, rating scale, partial credit, and many-facet data. Participants will have the opportunity to use current Rasch software.
The format will consist of eight self-contained units. The units are: Introduction to Rasch Measurement; Item and Person Calibration; Dichotomous and Polytomous Data; Performance and Judged Data; Applications of Rasch Measurement I and II; Examples of Rasch Analyses; and Analysis of Participants Data. The material covered is these units are an overview of material that would normally be covered in approximately two to three graduate level measurement courses. The co-directors will divide the topics in each session to maximize individual strengths.
Registration includes the full 2-day workshop, a continental breakfast each morning, over 550 pages of handouts and tutorial material, a copy of Introduction to Rasch Measurement (698 pages), Rasch Measurement: Advanced and Specialized Applications (470 pages), Criterion-Reference Testing: Practice Analysis to Score Reporting using Rasch Measurement Models (560 pages), and a one-year subscription to the Journal of Applied Measurement. See www.jampress.org for more details on these publications. The cost is $500 for professionals and $375 for students.
Audience: Anyone interested in learning about the practical aspects of Rasch measurement. Previous training in measurement is highly recommended, but not necessary. Though knowledge of the psychometric nomenclature is important.
Directors Names: Everett V. Smith Jr. and Richard M. Smith
Richard M. Smith, Editor
Journal of Applied Measurement
P.O. Box 1283
Maple Grove, MN 55311, USA
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