[Rasch] FW: Upcoming AERA Conference

Stephanou, Andrew Andrew.Stephanou at acer.edu.au
Tue Apr 23 09:14:52 EST 2013


Sent to the list on behalf of Tim O'Neil


From: Tim O'Neil [mailto:t66oneil at yahoo.com]
Sent: Monday, 22 April 2013 8:57 PM
To: rasch
Subject: Upcoming AERA Conference

For Rasch SIG members and others attending the upcoming American Educational Research Association annual conference in San Francisco, I wanted to note that you can find a listing of Rasch specific papers and presentations in the latest issue of RMT (http://www.rasch.org/rmt/rmt264.pdf).

Additionally I wanted to make SIG members aware of the details for the Rasch SIG Business meeting. The meeting is scheduled for Saturday, April 27th, from 6:15pm to 7:45pm in the Parc 55, Third Level – Powell I.  At the meeting I will provide a brief State of the SIG address then relinquish the floor to this year’s speaker, Ed Wolfe who will be presenting on “Four Ways of Learning: Modeling Raters.”  Here’s a brief description to whet your appetite:

In a 2012 Educational Measurement: Issues and Practices article, I argued that future useful research regarding rater effects should seek to merge two lines of research (psychometric and psychological) that have, to date, remained relatively isolated from one another as they relate to this topic. Specifically, I argued that we need to think carefully about and develop causal models regarding how rater effects come to exist. In this presentation, I discuss four examples of research that relate to that goal. First, I present a causal model of rater effects that stems from psychometric and psychological literature. Second, I discuss research that led to the development of a cognitive model of the rating process. Third, I present results of a preliminary study of the interaction between response content and manifest rater effects. Finally, I present results of a study of rater centrality that illustrates how we can improve psychometric modeling by thinking more carefully about how to measure rater effects.

As always, please do stop by the JAM Press booth in the Exhibit Hall while you are at AERA for Rasch publications thanks to Richard Smith.
I look forward to seeing many of you next week.  Safe travels.

Sincerely,

Tim O'Neil

Chair Rasch Measurement AERA Special Interest Group
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