<br>I posted this question again, but only got one response. I hope this time I'll be lucky
<br>I have a question and I hope that you can help me.
<br>Here in my country, people discuss the issue of building a large item bank with open-ended (not multiple choice, we never use them) calibrated items (say 1000 items), publish this item bank on the web, and then use this item bank to draw items to build tests for high-stakes tests. The concept is that anyone who can memorize 1000 open-ended items deserves to pass these high-stakes university entrance exams anyway. The idea is that this would minimize the errors during test construction, and we would be able to keep the difficulty of tests constant fro year to year. Has this ever been discussed there? How do you personally see this? Are you aware of any similar initiatives anywhere in the world?
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<br>---------[ Received Mail Content ]----------<br>
<br><b>Subject : </b>[Rasch] JAM Reviewers<br>
<br><b>Date : </b>Wed, 13 Sep 2006 00:42:00 +0000<br>
<br><b>From : </b>email@example.com<br>
<br><b>To : </b>firstname.lastname@example.org (Rasch Listserve)<br>
<br>Dear List Serve Members,
<br><br>Every three years we send out a call for new reviewers for the Journal of Applied Measurement. Our belief is that we need to continually refresh our pool of reviewers to reflect current trends in measurement and scholarship. JAM is a peered reviewed journal and the success of the journal depends on the timely and constructive reviews provided by our reviewers. Without our reviewers and the support that they provide to the authors seeking to publish in JAM, the entire process would come to a stand still. Many of the authors who publish in JAM comment on the helpful advice provided by our reviewers and the supportive nature of the reviews. If you would be willing to review one to two manuscripts each year, please send your name, e-mail address, and postal address to me at the e-mail address listed below. A brief paragraph about your areas of interest would be helpful, as we try to match the manuscripts for review with the reviewer's interests. As always your sup!
port of t
<br><br> he jou
<br><br>rnal is greatly appreciated.
<br><br>If you want to learn more about the journal you can visit our website listed below.
<br><br>Please do not reply to this e-mail, as it will be distributed to the entire website.
<br><br>Richard M. Smith, Editor
<br><br>Journal of Applied Measurement
<br><br>P.O. Box 1283
<br><br>Maple Grove, MN 55311 USA
<br><br>(JAM web site)
<br><br>voice: 763-268-2282 (w)
<br><br>fax: 763-268-2782 </BLOCKQUOTE><br><br><br><font color=# style='font-size: 9pt;'>Dr. Iasonas Lamprianou
<br>CFAS, School of Education
<br>The University of Manchester
<br>Oxford Road, Manchester M13 9PL, UK
<br>Tel. 0044 161 275 3485